Course Identification

A theoretical and practical introduction to scanning probe microscopy (SPM)
20182011

Lecturers and Teaching Assistants

Dr. Sidney Cohen
N/A

Course Schedule and Location

2018
First Semester
Tuesday, 11:15 - 13:00, FGS, Rm 2
07/11/2017
6

Field of Study, Course Type and Credit Points

Chemical Sciences: Lecture; Elective; 2.00 points
Chemical Sciences (Materials Science Track): Lecture; Elective; 2.00 points

Comments

Recommendation of research advisor required. For second-year MSc. students and above.

Prerequisites

No

Restrictions

12

Language of Instruction

English

Attendance and participation

Required in at least 80% of the lectures

Grade Type

Numerical (out of 100)

Grade Breakdown (in %)

15%
45%
40%
lab reports comprise some of weekly assignments

Evaluation Type

Examination

Scheduled date 1

20/02/2018
FGS, Rm B
1000-1200
N/A

Scheduled date 2

N/A
N/A
-
N/A

Estimated Weekly Independent Workload (in hours)

3

Syllabus

Scanning Probe Microscopy (SPM) stands at the heart of nanoscale science. This course will cover the fundamental physical principles behind the technique, considerations in the operation of the instrument, aspects of data acquisition and analysis, and applications.  Subjects will be presented in context of the science behind them, and reinforced by several laboratory sessions. The course will address the 3 basic questions – Why? How? and What?

Why – SPM is needed vs. other microscopies and surface analysis tools and why it complements and contrasts those other techniques;

How is it done - Principles of SPM Instrumental design and operation: Feedback, vibration isolation, signal and noise considerations, identifying and eliminating artifacts; how to choose the right probe and operating conditions; Data Analysis and image processing - Use and misuse of different filtering in data presentation, handling of varying dynamic range, statistical and spectral analyses

What can we measure: Surface Forces in and out of contact; Capillary effects; electronic energy levels and electron transport; Surface Potentials; optical and electrical spectroscopies; lithography; devices

Who -  The course is for 2nd year MSc. or Ph.D. students, with recommendation of the research advisor.

The course will use a combination of frontal and online lectures,  laboratories and discussions designed  for strengthening the understanding
 

Lectures

Week 1 – General Introduction, SPM development and application in context of other microscopy and surface analysis tools.

Week 2 – Data and image processing and analysis

Week 3 – Laboratory – Image analysis

Week 4 – SPM Instrumentation fundamentals – control systems (feedback), vibrations and vibration isolation, motion transducers: lab visit.

Week 5 – Surface forces, and how they are embodied in AFM force curves

Week 6 – Lab – force curves

Week 7 – Oscillating modes

Week 8 – Lab – oscillating modes

Week 9 – SPM-based nanolithography, thermal-based modes

Week 10 –Scanning tunneling microscopy and electrical measurements

Week 11 –Scanning probe optical-based studies

Week 12 – 13 – SPM applications in varied fields such as semiconductor industry, materials research, sensors, cosmetics, and medicine.

Week 14 – Summary

Learning Outcomes

Upon successful completion of this course students should be able to:

  1. Describe the fundamental components of any scanning probe microscope – detection of physical quantity measured;  meaning of setpoint; operation of control system acting to reduce error signal by  feedback; transducing voltage signal so motion
  2. Predict the effect of various scanning parameters – feedback gain, scan speed, setpoint, on the image obtained.
  3. Know how to choose an appropriate probe and operating conditions for a specific sample and scientific problem.
  4. Decide which of the various modalities of scanning probe microscopy are appropriate for a specific sample/scientific question.
  5. Know the advantages and disadvantages of the technique relative to other microscopies.
  6. Critically read and review current literature which is based on scanning probe microscopy
  7. Identify artifacts in their work and that of others
  8. Be familiar with realized and potential applications of SPM in practical and industrial environments.
  9. Propose standard SPM experiments for solving a specific scientific problem.
  10. Perform basic image manipulation and analysis procedures (levelling, filtering, histogram adjustment, statistical and grain analysis)

Reading List

Scanning Tunneling Microscopy and Spectroscopy Theory, Techniques, and Applications ed. Dawn Bonnel (1993); Atomic Force Microscopy, Peter Eaton and Paul West 2010; Scanning force microscopy of polymers Vancso, G., Schonherr, H. 2010; Amplitude Modulation Atomic Force Microscopy Ricardo García 2010.

Electronic resources and articles (to be announced)

Website

N/A